Combining Deep Learning with Object Based Image Analysis (OBIA)

Keith Peterson

Keith Peterson, Christian Weise – Trimble

WK2

Recently, deep learning (DL) has become the fastest‐growing trend in data analysis and has been widely and successfully applied to various feature extraction tasks. In the context of remote sensing the combination of DL with OBIA (object based image analysis) offers the flexibility to select the optimal working method inside the complete feature extraction workflow. This workshop will explore the accelerated usage of deep learning with object based image analysis using Trimble eCognition Developer software.

March 23 @ 13:00
13:00 — 15:00 (2h)

Add to Your Calendar